IEC IEC 61326-2-7 Edition 1.02025-12 INTERNATIONAL STANDARD Electricalequipmentformeasurement,control and laboratoryuse-EMC requirements - Part 2-7: Particular requirements - Test configurations, operational conditions, testlevelsandperformancecriteriafordeviceswithEthernet-APLinterfaces IEC 61326-2-7:2025-12(en) ICS 17.220.20; 25.040.40; 33.100.20 ISBN 978-2-8327-0892-7 THIS PUBLICATIONIS COPYRIGHTPROTECTED Copyright@2025IEC,Geneva,Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanicai, including photocopying and microfilm, without permission in writing from either IEc or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright IEC member National Committee for further information. IEC Secretariat Tel.: +41 22 919 02 11 3, rue de Varembe [email protected] CH-1211 Geneva 20 www.iec.ch Switzerland About the IEC International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the IECpublicationssearch- IEc Products &Services Portal-products.iec.ch webstore.iec.ch/advsearchform Discover our powerful search engine and read freely all the The advanced search enables to find IEC publications by a publications previews, graphical symbols and the glossary. variety of criteria (reference number, text, technical With a subscription you wili always have access to up to date committee, ...). It also gives information on projects, content tailored to your needs. replaced and withdrawn publications. Electropedia -www.electropedia.org IEc Just Published-webstore.iec.ch/justpublished Stay up to date on all new IEC publications. Just Published containing more than 22 500 terminological entries in English details all new publications released. Available online and and French, with equivalent terms in 25 additional languages. once a month by email. Also known as the International Electrotechnical Vocabulary (IEV) online. IECCustomerServiceCentre-webstore.iec.ch/csc If you wish to give us your feedback on this publication or need further assistance, please contact the Customer Service Centre:[email protected]. Warning! Make sure that you obtained this publication from an authorized distributor. IEC61326-2-7:2025@IEC2025 CONTENTS FOREWORD 3 1 Scope 5 2 Normative references. 3 Terms,definitionsand abbreviatedterms. 6 3.1 Terms and definitions 6 3.2 Abbreviated terms.. 9 4 General 10 4.1 General. 4.2 General considerations on EMC testing of devices with APL interface... ..10 4.3 Structureof anAPLsystem 4.4 Structure of the shield connection of an APL system .11 5 EMCtestplan 12 5.1 General 5.2 Configuration of EUT during testing. 14 5.3 Operating conditionsof EUTduringtesting. 14 5.4 Specificationoffunctional performance. 14 5.5 Test description. 14 6 Immunity requirements. 6.1 General. .15 6.2 Conditions during the test.. 15 6.3 Immunity test requirements. .15 6.3.1 General..... 6.3.2 EMC test setup.. .18 6.4 Random aspects. .36 6.5 Performance criteria. .36 6.5.1 General... .36 6.5.2 Performance criterion A 37 6.5.3 Performance criterion B .37 6.5.4 Performance criterion C. .37 1 Emission requirements. ..37 7.1 Conditions during measurements ..37 7.2 Emission limits .38 8 Test results and test report .38 9 Instruction foruse. ..38 Bibliography. ..39 Figure 1 - APL System structure for APL FIELD SWITCHES with Ethernet UPLINK PORT(s) ........ 10 Figure 2 - APL System structure for APL FIELD SwITCHES with APL TRUNK powered port(s)...... 11 Figure 3 -APL infrastructure overview . 12 Figure4-APLEMCTESTMASTERcommunication. .13 Figure5-ESD test setupfor an APL FIELD DEVICE with APL PORT and optional power supply port..... ..19 Figure6-Radiated RF test setupfor an APL FIELD DEVICEwith APL PORT and optional power supply port........ ..20 1 IEC6132