IEC IEC61193-2 Edition1.02007-08 INTERNATIONAL STANDARD Qualityassessment systems Part 2: Selection and use of sampling plans for inspection of electronio componentsandpackages IEC 61193-2:2007(E) THISPUBLICATIONISCOPYRIGHTPROTECTED Copyright@2007IEC,Geneva,Switzerland either IEC or IEC's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining additional rights to this publication, IEC Central Office 3, rue de Varembe CH-1211 Geneva 20 Switzerland Email: [email protected] Web: www.iec.ch About the IEC The International Electrotechnical Commission (IEC) is the leading global organization that prepares and publishes International Standards for all electrical, electronic and related technologies. About IEC publications The technical content of IEC publications is kept under constant review by the IEC. Please make sure that you have the latest edition, a corrigenda or an amendment might have been published. Catalogue of IEC publications: www.iec.ch/searchpub The IEc on-line Catalogue enables you to search by a variety of criteria (reference number, text, technical committee...). It also gives information on projects, withdrawn and replaced publications. : IEC Just Published: www.iec.ch/online news/justpub Stay up to date on all new IEC publications. Just Published details twice a month all new publications released. Available on-line and also by email. . Electropedia: www.electropedia.org The world's leading online dictionary of electronic and electrical terms containing more than 20 o00 terms and definitions Vocabulary online. -Customer Service Centre:www.iec.ch/webstore/custserv Centre FAQ or contact us: Email: [email protected] Tel.: +4122919 0211 Fax: +4122 919 03 00 IEC IEC61193-2 Edition 1.02007-08 INTERNATIONAL STANDARD Qualityassessmentsystems- Part 2:Selection and useof samplingplans forinspectionof electronic componentsandpackages INTERNATIONAL ELECTROTECHNICAL COMMISSION R PRICECODE ICS 31.190 ISBN 2-8318-9297-X 61193-2 @IEC:2007(E) -2 CONTENTS FOREWORD INTRODUCTION. Scope. 6 2 Normativereferences 3 Terms and definitions Sampling system .. 4.1 Formation and identification of lots. 4.2 Drawing of samples. 4.2.1 Selectionofsampleitems. 4.2.2 Process of sampling 4.3 Sampling plans.. 4.3.1 Inspection level 4.3.2 Sampling plan for normal inspection 8 4.3.3 Acceptance number.. 8 4.3.4 Tightened or reduced inspection.. 8 5 Acceptance and rejection. 5.1 Acceptabilitycriteria.. 5.2 Disposition of rejected lots. Statistical verified quality limit (SVQL). 6.1 General. 6.2 CalculationoftheSVQL 10 AnnexA(informative)Estimation ofthe statistical verified quality limit (SvQL)in nonconforming items per million (x10-6) at a confidence limit 60 %.. 11 AnnexB(informative)RelationshipbetweenthisstandardandISO2859-1. 15 Annex C (informative) Example of application of this standard (lot-by-lot inspection of assessmentlevelEZinIEC/TC4O).... Bibliography. 18 Table1-Samplesize .8 Table2-Sample size code letters Table 3-Coefficients for confidence level 60 % (seealso A.5). Table A.1 - Statistical verified quality limits in nonconforming items per million (×10-6) ....12 TableA.2-npwithconfidencelimitof6o%foraccumulatednumberofnon- conforming itemsand coefficientCL 14 Table B.1-Sampling plans corresponding to Table2-A of ISO 2859-1. ...15 nonconforming).. .16 TableC.1-Lot-by-lotinspectionofassessmentlevelEZ-IEC/TC40 17 - 3 - 61193-2@IEC:2007(E) INTERNATIONALELECTROTECHNICALCOMMISSION QUALITYASSESSMENTSYSTEMS Part 2: Selection and use of sampling plans forinspectionofelectroniccomponentsandpackages FOREWORD The International Electrotechnical Commission (IEC) is a worldwide organization for standardization comprising 11 all national electrotechnical committees (IEC National Committees). .The object of IEC is to_promote international co-operation on all questions concerning standardization in the electrical and electronic fields. To Technical Reports, Publicly Available Specifi