IEC INTERNATIONAL STANDARD 61164 Second edition 2004-03 FORS Reliability growth - RNAb Statistical test and estimation methods USE ATT LOEA , SMP. PLiPI D BY BOOK SUPP LY BURE AU. IEC Reference number IEC 61164:2004(E) Publication numbering As from 1 January 1997 all IEC publications are issued with a designation in the 60000 series.For example,IEC 34-1 is now referred to as IEC 60034-1. Consolidated editions The IEC is now publishing consolidated versions of its publications.For example, edition numbers1.0,1.1 and 1.2 refer,respectively,to the,base.publication,the base publication incorporating amendment 1 and the base publication incorporating amendments 1 and 2. Further information on IEC publications The technical content of IEC publications is kept under constant review by the IEC, thus ensuring that the content reflects current technology.Information relating to this. publication,including its..validity,is available in the IEC Catalogueof FORLICE Information on the subjects under consideration and work in,progress undertaken by the technical committee which has prepared this publication,as well as the list SDINTI of publications issued,is also available from the following: RNALTU IEc Web Site(www.iec.ch) BOUSE Catalogueof IEC publications ATTH The on-line catalogue on the IEC web site(http:/www.iec.ch/searchpub/cur fut.htm) ISid committees and date of publication.On-lineinformationisalso available on recently issued publications,withdrawn and replaced publications,as well as CAT corrigenda. IQINC IEC Just Published NLAY, justpub/ip entry.htm)is also_availabie by email. Please contact the Customer SUPF Service Centre(see below)for further information LIEI CustomerServiceCentre If you have any questions regarding this publication or need further assistance, B please contact the Customer Service Centre: BOOK Email: [email protected] Tel: +41229190211 SUPI Fax: +41229190300 BURI AU. IEC INTERNATIONAL STANDARD 61164 Second edition 2004-03 FOR Reliability growth RNNb Statistical test and estimation methods USE ATTN LOEA , SMP. PLIPI D BY BOOK SUPP LY BURE AU. IEc 2004—Copyright -all rights reserved Nopart of thispublicationmay bereproducedor utilized in any form or by any means,electronic or mechanical,includingphotocopyingand microfilm,without permission writing from the publisher. International Electrotechnical Commission,3,rue deVarembe,PO Box 131.CH-1211 Geneva 20,Switzerland Telephone:+41229190211 Telefax:+41229190300 E-mail:[email protected] Web:www.iec.ch XA Commission Electrotechnique Internationale PRICECODE Forpricesee crrentcatalogue 61164 IEC:2004(E) CONTENTS FOREWORD INTRODUCTION Scope 2 Normative references 3 Terms and definition 4 Symbols 5 Reliability growth models in design and test 6 Reliability growth models used for systems /products in design phase.... 6.1 Modified power law model for planning of reliability growth in product design FDRC phase .... 13 INFNS 6.2 Modified BayesianIBM-Rosner model for planning reliability growth in design RNAP phase ... 16 Reliability growth planning a tracking in the product reliability growth testing ME 7.1 Continuous reliability growth model... THIS 7.2 Discrete reliability growth model... 20 LOCA 8 Use of the power law model in planning reliability improvement test programmes.. TION 9 23 ONRA 9.1 Overview 23 , SCH 9.2 Growth tests and parameter estimation 23 PLXB 9.3 Goodness -of-fit test 27 D NGA 9.4 Confidence intervals on the shape parameter 29 BObRF 9.5 Confidence intervals on current MTBF SUPP 9.6 Projection technique LY BURE Annex A(informative ）Examplesfor planning and analytical modelsused in design AU. and test phase of product development ... 37 Annex B(informative)The power law reliability growth model -Background information..... Bibliograph Figure 1-Planned improvement of the average failure rate or reliability 12 Figure A.1- Planned and achieved reliability growth - Example .. 40 Figure A.2- Planned reliability growth using Bayesian reliability growth model... Fi