IEC IEC 60749-34-1 Edition 1.0 2025-06 INTERNATIONAL STANDARD NORME INTERNATIONALE Semiconductor devices-Mechanicaland climatictest methods Part 34-1:Power cyclingtestfor power semiconductormodule Dispositifs a semiconducteurs -Methodes d'essais mecaniques et climatiques Partie34-1:Essaidecyclesenpuissancepourmodulesdepuissancea semiconducteurs IEC 6074 9 34- 1:20 25- 06(e ICS 31.080.01 ISBN978-2-8327-0496-7 fr) IS THIS PUBLICATION COPYRIGHT PROTECTED Copyright 2025IEC, Geneva, Switzerland All rights reserved. Unless otherwise specified, no part of this publication may be reproduced or utilized in any form or by any means, electronic or mechanical, including photocopying and microfilm, without permission in writing from either IEC or IECc's member National Committee in the country of the requester. If you have any questions about IEC copyright or have an enquiry about obtaining aditional rights to this publication,please contact the address below or your local IEC member National Committee for further information. Droits de reproduction reserves. Sauf indication contraire, aucune partie de cette publication ne peut etre reproduite ni utilisee sous quelque forme que ce soit et par aucun procede, electronique ou mecanique, y compris la photocopie et les microfilms, sans laccord ecrit de I'IEC ou du Comite national de IIEC du pays du demandeur.Si vous avez des questions sur le copyright de IEC ou si vous desirez obtenir des droits supplementaires sur cette publication, utilisez les coordonnees ci-apres ou contactez le Comite national de I'IEc de votre pays de residence IEC Secretariat Tel. :+41229190211 3,rue de Varembe
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