EN 60749-33 EUROPEANSTANDARD NORME EUROPEENNE EUROPAISCHENORM April 2004 ICS 31.080 English version Semiconductor devices- Mechanical and climatic test methods Part33:Acceleratedmoistureresistance Unbiased autoclave (IEC60749-33:2004) Dispositifsasemiconducteurs Halbleiterbauelemente Methodesd'essaismecaniques Mechanische und klimatische etclimatiques Prufverfahren Partie33:RésistanceaIhumidité Teil33:BeschleunigteVerfahrenfur accélérée- Feuchtebestandigkeit Autoclavesanspolarisation Autoclaveohneelektrische (CEI60749-33:2004) Beanspruchung (IEC60749-33:2004) This European Standard was approved by CENELEC on 2004-04-01. CENELEC members are bound to comply with the CEN/CENELEC Internal Regulations which stipulate the conditions for giving this European Standard the status of a national standard without any alteration. Up-to-date lists and bibliographical references concerning such national standards may be obtained on application to the Central Secretariat or to any CENELEC member. This European Standard exists in three official versions (English, French, German). A version in any other notified to the Central Secretariat has the same status as the official versions. CENELEC members are the national electrotechnical committees of Austria, Belgium, Cyprus, Czech Lithuania, Luxembourg, Malta, Netherlands, Norway, Poland, Portugal, Slovakia, Slovenia, Spain, Sweden, Switzerland and United Kingdom. CENELEC EuropeanCommitteeforElectrotechnical Standardization Comite Européen deNormalisation Electrotechnique Europaisches KomiteefurElektrotechnische Normung CentralSecretariat:ruedeStassart35,B-1050Brussels @ 2004 CENELEC - All rights of exploitation in any form and by any means reserved worldwide for CENELEC members. Ref. No. EN 60749-33:2004 E EN60749-33:2004 Foreword The text of document 47/1737/FDIS, future edition 1 of IEC 60749-33, prepared by IEC TC 47, Semiconductor devices, was submitted to the IEC-CENELEC parallel vote and was approved by CENELEC as EN 60749-33 on 2004-04-01. The following dates were fixed: latest date by which the EN has to be implemented at national level by publication of an identical national standard or by endorsement (dop) 2005-01-01 latest date by which the national standards conflicting with the EN have to be withdrawn (dow) 2007-04-01 AnnexZAhas beenadded byCENELEC. Endorsement notice The text of the International Standard IEC 60749-33:2004was approved by CENELEC as a European Standard without any modification. EN60749-33:2004 SEMICONDUCTORDEVICES MECHANICALANDCLIMATICTESTMETHODS- Part 33:Accelerated moisture resistance- Unbiased autoclave 1 Scope and object The unbiased autoclavetest is performed to evaluate themoistureresistance integrity of non- hermetic packaged solid-state devices using moisture condensing or moisture saturated steam environments. It is a highly accelerated test which employs conditions of pressure, through the external protective material (encapsulant or seal) or along the interface between the external protective material and the metallic conductors passing through it. This test is used to identify failure mechanisms internal to the package and is destructive. 2 Normativereferences The following referenced documents are indispensable for the application of this document. For dated references, only the edition cited applies.For undated references, the latest edition IEC 60749-24,Semiconductor devices-Mechanical and climatictest methods-Part24: Acceleratedmoistureresistance-UnbiasedHAsT humidity under pressure 3.1 Records A permanent record of the temperature profile for each test cycle is recommended so that the stress conditions can be verified. 3.2 Devices under stress Devicesunderstress shallbeno closerthan3o mmfromtheinternal chamber surface and shall not be subjected to direct radiant heat. 3.3 lonic contamination lonic contamination of the test apparatus and storage chamber shall be controlled to avoid testartefacts. 3.4 Distilled or deionized water Distilled or deionized